High-voltage SiC Device Testing |
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Specifications |
| Voltage | 10kV |
| Current | 100A |
| Temperature | 25°C to 200°C |
| Variable pulse width for current setting |
| Optical fiber isolation |
Dynamic Testing Capability
- Turn-on Delay
- Turn-on Rise
- Turn-on Energy
- Turn-off Delay
- Turn-off Fall
- Turn-off Energy
- Diode Reverse Recovery Time
- Diode Reverse Recovery Energy
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